Bruker分析工具允许以厘米为单位的地质材料表征到亚微米尺度。bob综合游戏从独立仪器到用于扫描电子显微镜的检测器,对样品中对矿物学,纹理和地球化学分布的基本了解从未如此强大。
岩石中矿物质的空间分布的准确鉴定和表征提供了理解岩石形成的基本过程的基础。根据任务,可能需要在手工样本,单粒和亚颗粒量表上进行表征,并且需要将矿物化学与纹理关系相关联。Bruker产品交叉这些量表和数据需求与诸如:
M4 TORNADO和M4 TORNADOPLUSallow rapid mapping of minimally prepared samples allowing determination of mineral species and textural distributions in solid and granulated samples, with mineral chemistry measured down to ppm levels
QUANTAX扫描电子显微镜的检测器,包括EDS,WDS和EBSD, providing comprehensive structural and compositional data on any solid sample to sub-micron scales
AMICSautomated mineralogy solution for scanning electron microscopes and micro-XRF, driving rapid mineral identification and characterization for wide ranging applications in geoscience and geological engineering
D2 PHASER,D8 DISCOVER和D8 ADVANCErange of X-ray Diffraction solutions covering all applications and needs from compact, benchtop instruments to high-resolution single-crystal characterization.
岩石中主要,次要和微量元素的可视化基础是我们对许多地质过程的理解。通常局限于薄部分或以下的规模,在较大样品中的地球化学分区的快速表征为进一步研究提供了更多背景,从而为其他分析方法提供了更健壮的子采样决策,并有可能减少更昂贵的样品总数技术。允许地球化学可视化的布鲁克产品包括:
M4 TORNADOmicro-XRF providing geochemical mapping of large samples and detection down to 10's of ppm, leading to accurate characterization of geochemical distribution in any solid sample, and quantification of bulk geochemistry through integration of map data.
M4 TORNADOPLUSis a micro-XRF optimized for enhanced light element detection, with large-area light element SDD detectors and capability for analysis under vacuum and a He atmosphere, allowing element detection down to C.
XTrace–QUANTAXMicro-XRF,升级SEM以允许在同一仪器上进行跟踪元素分析。当与快速阶段(一种基于模块化的压电系统)结合使用时,可以使用Xtrace进行高速映射,直接安装在标准的SEM阶段上。
全岩地球化学是对地质过程研究的组成部分,在该过程中,必须进行精确的主要,次要和微量元素化学。Bruker提供了适合每种应用和分析需求的全范围的能量分散和波色散XRF解决方案。
TRACERhandheld-XRF and CTX portable benchtop ED-XRF instruments provide portable and compact solutions at affordable budgets while not compromising on performance
S2 PUMA高容量台式ED-XRF单元可以从C到AM分析,示例更换系统可容纳多达20个样品
S6 JAGUAR紧凑的WD-XRF以紧凑的格式提供高性能的大量地球化学性能,而S8 TIGERsequential WD-XRF allows major and trace element analyses in a single run.
Advances in our understanding of geologic processes have demonstrated the need for, and benefits derived from, knowing the textural context of dateable minerals in rocks. Commonly the minerals used for geochronology are accessories – fine-grained and low abundance – leading to significant effort and resources expended on locating them in thin sections or mineral separates. Micro-XRF and SEM-based automated mineralogy solutions can speed up this process, correctly identifying minerals and placing them in their textural-mineralogical context.
M4 TORNADOMicro-XRF允许对大型样品进行地球化学映射,从地球化学代理或直接应用Bruker的Amics自动化矿物学解决方案来提供矿物质分布
AMICSfor scanning electron microscopes provides automated mineralogical mapping of thin sections and polished grain mounts, with focused detection of key minerals and compositional quantification for robust classification
Point analysis and mapping of mineral structure and composition, discriminating polymorphs or chemically similar but structurally different minerals, with spectral reference libraries allowing rapid and routine characterization and OPUS™ software optimizing spectral matching.
Chemical structure at the molecular scale where elemental data alone is insufficient, including organic matter characterization, prosody and permeability studies, analysis of glasses, fluid and melt inclusions.