FT-IR显微镜

LUMOS II

The LUMOS II is a stand-alone FT-IR microscope that excels in failure analysis, material research and particle analysis. It is compact, precise and features ultrafast chemical imaging by FPA technology.

Exceptional IR.

出色的视觉效果。超快成像。

横幅Lumos II

Highlights

易于有效的精确

The FT-IR Microscopy and Imaging Powerhouse

Inroduction of the LUMOS II | Product Presentation
The LUMOS II product manager presents the LUMOS II and its features.
我们的声明

红外显微镜的本质方式。

更多的样品准备的空间. More化学成像的速度. MoreATR,传播和反射显微镜中的完整性。这就是我们所说的真正的游戏规则 - 没有讨论。

Features

Features

LUMOS II technical features:

  • Standard TE-MCT detector
  • 插件:没有液氮,没有干气清除
  • Optional FPA-imaging detector
  • Novel PermaSure+ calibration technology
  • Fully motorized and automated hardware
  • Accomodates samples of up to 40 mm in height
  • 包括激光在内的组件的长寿命
  • Inert to high humidity (ZnSe Optics)
  • Stand-alone design, small footprint
  • Low power consumption

LUMOS II provides:

  • 软件指导测量的易用性
  • High-definition spectral and visual data
  • 没有液氮的高红外敏感性
  • Visual resolution in the sub micrometer range
  • Ultrafast FPA imaging performance
  • FPA imaging ATR/transmission/reflection
  • Easy access to the sample stage
  • Compliance to cGMP and FDA 21 CFR p11
  • Automated OQ/PQ/pharmacopeia tests
  • Anytime upgradeability

Applications

  • 故障分析
  • Particle & surface analysis
  • Industrial manufacturing
  • 法医科学
  • Life science
  • Polymers & plastics
  • Environmental science
  • 药品
什么是Lumos II

The Anywhere / Anyone FTIR Microscope

我们认为是时候让先进的techniques available to every user, regardless of their skill level. The benefits ofFT-IR imaging and microscopyare too great to restrict access by cumbersome hard- and software.

From the start the LUMOS II was meant to make FT-IR imaging faster, easier, more accurate and reliable – and even more fun. Of course, this required us to include new and improve uponproven technology.

That's why we tailored the LUMOS II, its software and user interface specifically to the user.Beginners get perfect results在很快的时候,专家保持全部仪器控制。

优秀的FT-IR显微镜

Superior µ-ATR FT-IR Capabilities

归结为:更好的乐器。更好的结果。

无论是传输,反射还是减弱总反射率(ATR), the LUMOS II is always the right choice. But its greatest strength is ATR microscopy enhanced by FPA technology. This makes the LUMOS II a universal tool for failure analysis and product development.

简而言之,它的ATR功能是无与伦比的。时期。不要满足不可靠的手动ATR配件 - 尽力而为。获取Lumos。

The retractable crystal is controlled by high precision piezoelectrical motors and integrated into the lens. This allows you to enjoy a clear view of the sample while your measurement still takes place exactly where you want it.

经过验证的技术

Convincing Innovation

应用程序的耐力和功率。

For us it is a natural thing to pass on the best technology to our customers. Of course, this also applies to the LUMOS II.

The RockSolidTM干涉仪可以保证持续的性能,而现代电子设备可确保机械精度和低能消耗。同时,该软件可以监视仪器的有效性,并始终确保正确的功能。

Applications

Lumos II申请视频

Coating defect analysis by ATR-FT-IR microscopy.
PCB failure analysis by FT-IR microscopy.
FT-IR显微镜通过纺织品和羊毛质量控制。
Diamond gemstone analysis by FT-IR microscopy.
IR显微镜进行的粒子根本原因分析。
通过宏ATR成像进行的多层膜和层压分析。
FT-IR显微镜对DLC层的涂层厚度分析。
Composite multi-layer polymers analyzed by ATR-FT-IR.

Testimonials

Testimonial: Microplastics

The team led by Dr. Martin Löder and Prof. Christian Laforsch maintains one of the leading microplastics analysis laboratories in Germany.

News & Events

Opus版本8.7 |Lumos II |Q3 2021

新功能:High Performance Chemical Image Generation by New Adaptive K-means Clustering Function

This new function is the logical next development step for our well known Cluster analysis function.The Adaptive K-means Clustering Function is based on a new algorithm, which enables a non-supervised and autonomous determination of spectral variance within your imaging or mapping results.

  • Forecasting or time consuming searching of the included amount of chemical classes is no longer been necessary as the algorithm can predict all included chemical classes by itself.
  • 该主要功能对于较大数据集中未知样品或小结构的各种化学成像和分布分析很重要。
  • Together with the LUMOS II analysis and evaluation is as easy as possible and safes your valuable time and nerves.

新功能:“Cluster ID” Function for Identification of Classes in 3D Spectral Data

我们的新群集ID函数可以使用Opus函数在成像和映射数据中识别簇:库中的频谱搜索,快速比较或身份测试。

  • Easy determination of the chemical identity of classified sample components for particles, layers in laminates, components of pharmaceutical tablets and other inhomogeneous materials.
  • 提供了有关数量,大小,当然还有所有分析结构的身份的可靠且全面的统计报告,并将粒子和技术清洁度分析带到新的自主级别。

Updated Feature:"Find Particles" function now contains a novel particle detection method

现在可以将验证的“查找粒子”软件应用于:视觉和IR图像。使用此更新的功能,您可以根据Lumos II测量的化学图像进行粒子检测。

  • While particle recognition for low contrast structures and off-white/transparent particles/fibers on off-white filter membranes can be tedious, a postrun particle determination based on the chemical IR image allows you to determine quantity and size of particles from your imaging or mapping results.
  • With the Find Particle Function together with the LUMOS II you will never miss any detail – neither in visual nor in IR range.
通过新的自适应K-均值聚类函数完全自动创建化学图像。
Automatically recognized particles on an aluminum oxide filter. Particles are immediately classified by size and identity with the new "Cluster ID".

更多的Information

FT-IR显微镜s Literature Room

Learn more about our FT-IR microscopes and solutions by downloading related literature.