QUANTAX Micro-XRF

The new Rapid Stage is specifically designed for SEMs to enable large area mapping over millimeter (mm) to centimeter (cm) scales. This will eliminate potential SEM X-ray intensity variation artifacts associated with low magnification mapping and thus enhance elemental and mineralogical information in a timeous manor that was previously not possible.

观察样品中元素变化的能力对于理解地质过程和矿石沉积物很重要。在SEM上包含Micro-XRF的双源系统可在大面积上启用元素X射线映射，该区域显示了PPM量表上的主要，次要且还可以跟踪元素。

The combination of micro-XRF with SEM enables the potential to analyze samples at multiple scales, from centimeters (cm) to millimeters (mm) to micrometers (µm) and below within a solitary system. Thus, by adding the micro-XRF to an SEM you convert your SEM to a dual source system, meaning that there are 2 excitations sources, the e-beam and photon beam. Either source can be used individually, or simultaneously, to generate sample X-rays that will be measured using the same EDS detector.

提出了一种地图地幔garne SEM-XRF元素t-spinel peridotite from the diamond-bearing Newlands kimberlite (South Africa, Kaapvaal Craton). The intensity of the various elements indicates certain minerals that are present in the sample.

使用SEM-XRF可以对具有地形的样品进行大面积映射（超图）。也就是说，需要最少的样品制备，可以直接分析样品而不会降低任何降低。这在对土壤的分析中尤其重要，在这种分析中，任何形式的样品制备（例如安装，抛光或碳涂层）都可能改变样品。

As X-rays may pass through matter, X-ray Fluorescence (XRF) allows the determination of layer thickness. Using micro-XRF on SEM, the layer analysis (thickness and composition) is rendered feasible with spatial resolution at the micrometer scale. Layer analysis is strongly based on quantification using atomic fundamental parameter (FP).