用纳米凸缘的电接触电阻测量的组合为纳米级的接触电阻进化和材料变形行为提供了有价值的新见解。通过通过导电纳米丁烯探针通过电流,可以确定纳米级电特性作为应用探针力和探针位移进入样品表面的函数。In addition to quantitative measurement of I-V characteristics of nanoscale electrical contacts, new insights can be gained in the areas of thin film fracture, dislocation nucleation, deformation transients, contact resistance, fatigue, diode behavior, tunneling effects, piezoelectric response, phase transformations, and more.
Bruker的NanoEgR利用了Bruker的专有静电换能器的新模型,其被修改为通过导电压痕探针从样品偏置级提供电气路径,以便能够连续地测量作为施加力和探针位移的函数的演化电接触条件。在反馈控制下运行,纳米可以在高度控制的施加负载或探针位移条件下从纳米级探针触点开始恒定电压或I-V扫描测量。