Minerals: Exploration and Discovery

探索中的探路者和指示矿物

探路者和指标矿物质提供了一种强大且具有成本效益的手段,可以评估其矿产潜力的大面积。布鲁克(Bruker)正在与行业领导者积极合作,开发新的分析方法,以改善矿物质识别和构图表征工作流程。

Introduction

Indicator Minerals

随着矿物勘探的成本,对可靠方法的需求进行了增长,以评估区域潜在性和改善目标的改进。探路者和指标矿物质提供了一种评估其矿物潜力大面积的方法,并在进一步钻探之前消除了可能的贫瘠区域。

布鲁克(Bruker)正在与行业领导者积极合作,开发新的分析方法,以改善矿物质识别和构图表征工作流程。了解准确的数据可以在地区级及其他地区进行高尺度的金属模型,Bruker致力于构建仪器和软件,为任何程序生成正确的数据输出。Bruker系统允许任何公司消除缺乏分析专业知识所带来的障碍,该解决方案是为内部实验室和区域勘探办公室设计的解决方案。布鲁克(Bruker)的全球地质团队可以帮助为所有区域探索需求找到适当的解决方案。

RIMS for Regional Exploration

Resistant Mineral Indicators of Regional Prospectivity and Fertility

Magmatic and hydrothermal minerals that are resistant to weathering and so end up in soil, till or stream sediments are increasingly targeted in mineral exploration as tests for overall district or regional prospectivity or vectors to mineralization. Key trace element contents of dateable minerals such as zircon, apatite, titanite and rutile provide windows into source magma chemistry, including crystallization temperatures, degree of fractionation, water content, and oxidation state, with geochemical data that ties directly to the age of sources rocks and their associated magmatic events. Resistant minerals formed during mineralizing events provide direct evidence for the exposure of hydrothermally altered zones within a water shed or upstream of glacial deposits, with their chemistries pointing toward mineralized versus barren environments or even discriminating between deposit types.

布鲁克(Bruker)为抗性指标矿物(RIMS)勘探计划的不同分析需求提供了解决方案:

  • M4 TORNADOandM4 Tornado Plusmicro-XRF provides rapid scanning of minimally prepared samples to provide spatially located geochemical data. Scan unpolished or coated scatter mounts of loose sediment or soil samples, crushed or intact rock, using geochemical proxies to identify minerals or integrate maps to calculate bulk compositions.
  • M4龙卷风的Amics自动化矿物学micro-XRF and Scanning Electron Microscope allows two levels of mineralogical identification and characterization.M4龙卷风amicprovides rapid scanning and evaluation of loose samples without the need for polishing or conductive coating, providing first order data to be fed back into decision making, and screening for further analysis. AMICS for SEM is a more traditional automated mineralogy approach working with polished samples, but with advanced data collection and reduction capabilities of Bruker's AMICS software. AMICS for SEM andM4 TORNADO完全兼容两种解决方案可以工作吗in tandem.

Distal Alteration Footprints

远端改变足迹的矿物指标

改变矢量和生育repre筛查sent early-stage exploration techniques that have application where exposures are limited or where exploration is dealing with partial or extensive cover. Designed to access low-level geochemical anomalies preserved in alteration minerals, the technique aims to detect alteration even at significant distance from a mineralized center, to vector toward and assess distance to the target, and evaluate potential fertility or endowment. Common target minerals include epidote and chlorite in the "greenrock" environment, alunite or clay minerals to aid vectoring in lithocap environments, or white micas, which may occur in the distal reaches of alteration zones but give clues to deposit type, alteration zone, proximity, and fertility.

Bruker Analytical Solutions允许我们的客户专注于他们的勘探需求,并完善其目标和矢量化策略。

  • M4 TORNADOandM4 Tornado PlusMicro-XRF可快速扫描钻头,RC芯片和沉积物样品,以生成地球化学图并识别矿物质矿物质。整合面积扫描以计算从地图内选择的子域中计算准确的散装组成,以比较异质变化的岩石中的组成。数据出口可以与现有的地球化学建模程序集成,以计算更改指数或建造3-D模型以支持健壮的决策。
  • 友善对于扫描电子显微镜,为改变矿物化学和远端足迹的检测提供了新的自动矿物学溶液。自动化的快速(短计)矿物识别可以补充驱动式长期量化,以准确表征绿色和远端足迹指示器矿物

Bulk Samples

散装样品中的探路者矿物

这needs of greenfields exploration commonly requires a rapid, low-cost solution to screen bulk samples. Screening methods that target pathfinder elements as proxies to make decisions in the field, or guide funneling of samples toward the appropriate mineralogical or compositional analysis technique. For rapid screening of bulk samples for the possible presence of pathfinder minerals solutions include:

  • 泰坦手持XRF,用坚固的箱子构建,泰坦探测器盾牌保证可以保护探测器窗口和可选的安全间隔台式支架,以最大程度地分析从mg到U
  • CTX,一种新的便携式单样本耐加固的台面XRF,并带有电池备份,用于分析从mg到U

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