Microscopes

Materials Research AFMs

帮助科学家在不断发展的材料科学学科中发现，理解和发表bob综合游戏

Produkte

High-Resolution AFMs for Challenging Research

由于原子力显微镜作为实现高级材料研究的主要技术进入了其第四个十年，因此其高分辨率数据已用于推动几乎无数的学科和应用程序中的发现。bob综合游戏自1980年代引入第一个商业系统以来，布鲁克一直在领导AFM能力的扩展。As the technology has matured, AFM has given scientists the opportunity to characterize features on ever more complex samples, and not only in topography. Our committment to helping you do more, and do it more easily, has kept Bruker AFMs at the very cutting-edge of instrumentation innovation. For example, Bruker AFMs, powered exclusively by PeakForce Tapping^®technology, are helping researchers advance new nanomechanical, nanoelectrical, and nanoelectrochemical research, on the order of three peer-reviewed published articles per day.

找到适合您应用的最佳AFM

维度XR SPM

Dimension XR

Extreme research systems for nanomechanics, nanoelectrical and nanoelectrochemistry

Dimension FastScan AFM

Dimension FastScan

世界上最快的高分辨率AFM

Dimension Icon

Most productive large-sample AFM in the world

多模8小时AFM

多模8小时

World's most extendable high-resolution AFM

Dimension Edge AFM

Dimension Edge

Best-value high-performance AFM

Innova AFM

Innova

Best place to start your AFM research

Dimension Icon-Raman

Highest performance AFM with integrated Raman spectroscopy

Innova-irisAFM

Innova-iris

最完整的TERS系统

NanoWizard NanoOptics AFM

NanoWizard NanoOptics

AFM优化，可与TERS，SNOM和共焦的基于传输的光谱技术结合使用

NanoWizard 4 XP纳米科学AFM

NanoWizard NanoScience

Multi-purpose, high-performance AFM with seamless light microscopy integration for biological and materials research

Bruker AFM探针

Bruker AFM探针

Find a wide variety of AFM probes, cantilevers and accessories in our online store. Our AFM expertise is built into every probe!

Nanoscale Infrared Spectrometers

Nanoscale Infrared Spectrometers

Bruker的纳米光谱仪是从纳米级到亚微米和宏观尺度的光热IR光谱的世界领导者。

AFM Modes

AFM Modes

Expand Your Applications with AFM Modes

Bruker拥有无与伦比的成像模式的套件，可以为每项调查提供AFM技术。

Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

Learn More About AFM Modes

Anwendungen

Applications

调查性质和纳米Surface Structures

Graphene Research

石墨烯和2D材料bob综合游戏

Advanced graphene and 2D materials property measurements

AFM Battery Research

电池材料bob综合游戏

Highest resolution materials characterization for advanced battery research

AFM research on polymers

Polymers

Nanoscale imaging of polymers structure and morphology

Gallery of Applications

Closed-loop, syndiotactic polpropylene in TappingMode, 5μm.Mehr

联合性聚丙烯的结晶动力学研究。原始聚合物在160°C下从室温（左）到完全熔化的状态进行快速加热。在128°C下的高温等温结晶促进了条件的平衡和比原始薄片晶体更大的形成。右图像在101分钟处显示部分结晶。

Image of C36H74 Alkane on HOPG. Individual lamellae clearly visible with spacing (~4.5nm) consistent with length of C36H74 chains in fully extended conformation.

Simultaneous topography and conductivity mapping of single-wall carbon nanotubes loosely attached on Au-patterned silicon using TR-TUNA, 1μm.

使用PeakForce QNM（PFQNM）在液体中成像的方解石晶格中的原子缺陷。Bede Pittenger博士获取的数据

Demonstrating highest resolution on a delicate molecular layer, the TappingMode images here reveal the molecular structure of methanol self-assembly on HOPG. Three images show 0.5nm step and herringbone pattern with spacing 5nm, as well as 0.5nm molecular spacing (small image scale bar 3nm). Length scale of rows suggest ordered methanol molecules tilted at different angles. Vertical scale on the 250nm scan is 1nm. Images acquired by Bede Pittenger, Ph.D.

铝硅酸盐玻璃的这种峰值敲击图像在空气中的工业样本上显示出最高的分辨率。bob娱乐平台保持尖端清晰度是关键。随后的扫描中的盲尖重建显示了大约1nm的尖端端半径，表明在这个具有挑战性的样品上尖端磨损可忽略不计。完整的图像扫描尺寸5UM，5000x5000像素。Peakforce设定值600pn，FastScan B探针。Shuiqing Hu博士获取的图像。

This current map produced in TUNA mode on HOPG demonstrates “lattice resolution” with spacing of 0.25nm. Traditionally, STM has been needed to achieve this sort of resolution in a current map. PeakForce TUNA application module, PF-TUNA probe, 60pA current range. 0.5nm scale bar on high-resolution image. Image acquired by Hartmut Stadler, Ph.D.

A DCUBE-PFM measurement clearly shows the domains flipping at different potential levels for each discrete pixel on a BiFeO3 thin film.

Detect the smallest structures with spatial resolution down to sub-molecular units of polymer chains with XR Nanomechanics. iPMMA adhesion image.

3D surface representing sample topography with false coloring by loss modulus. Blue areas have higher loss modulus and the red areas are lower loss modulus corresponding to the PS matrix and PMMA inclusions respectively. Loss modulus map generated by contact resonance via Bruker’s FASTForce Volume Nanomechanics mode. 5µm scan, ~ 590kHz, 256x256 pixels.

PeakForce QNM modulus images of graphene on hexagonal boron nitride, revealing a transition to a commensurate lattice upon alignment with highly localized strain relief. See also Nature Physics 10, 451–456 (2014).

Syndiotactic polypropylene domains (violet) surrounded by a PMMA (teal) matrix. Topographic data painted with modulus to allow easy identification of components, revealing lamellae formed by syndiotactic polypropylene that propagate through the PMMA matrix. Image size 8 µm.

Current imaging on vertically standing carbon nanotubes. Only possible with PeakForce TUNA.

Polymer brush structures imaged using PeakForce-HR. Scan size 1 μm at 5 Hz. Sample courtesy of S. Sheiko, University of North Carolina, Chapel Hill.

PeakForce TUNA current map of poly(3-hexylthiophene) (P3HT) organic conductive nanowires using 3V bias. Image shows a 3 μm scan area where the current varies from 0 to 80 pA.

Syndiotactic polypropylene (sPP) and polyethylene oxide (PEO) blend imaged with PeakForce-HR (3 µm at 5 Hz).

This modulus image shows the subtle transition between the ULDPE tie layer to the PS/LDPE sealant layer of cross sectioned packaging material. Mapping the modulus at high spatial resolution reveals lamella from the tie layer act as nucleation sites penetrating into the sealant and increasing lamellar ordering within 1 μm from the interface. Image size 3 μm.

用Peakforce Tuna获得的垂直碳纳米管地毯的高度（a）和电流（b）地图，它们无法通过接触模式进行映像。图像尺寸为1μm。

Atomic resolution height and adhesion of mica substrate on MM8 (15 nm scan) imaged with PeakForce Tapping.

Modulus map of polydiethylsiloxane (PDES) imaged using PeakForce QNM. Image shows a 3 μm scan area where the modulus varies from 1.5 to 15 MPa.

Closed-loop topography map of a kerf test structure showing contact holes inside dual-damascene trenches. The combination of the Dimension scanner and a Bruker FIB probe enabled mapping of this challenging geometry without damage to the probe tip.

使用深色升力SCM对SRAM样品进行精确的2D掺杂分析。图像尺寸15μm。

个人origami-D三角自组装NA on mica imaged in liquid reveal individual strands and fine structure at the connection points. 250 nm closed-loop image. Sample courtesy of P. Rothemund, Caltech.

硅DRAM电池的扫描电容数据。DC/DV测量提供的2D掺杂曲线概况允许可视化设备缺陷和提取关键参数（例如门长）。该图像以SCM/Dark Lift模式获取，以确保准确且无伪影的掺杂剂映射。25μm闭环图像。

Ressourcen

资源

Watch Our AFM Webinars

我们的网站inars cover best practices, introduce new products, provide quick solutions to tricky questions, and offer ideas for new applications, modes, or techniques.

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Additional Resources

Journal Club

Subscribe to our monthly Journal Club emails to keep apprised of recent research with AFMs.

AFM Materials Journal Club

AFM材料电子书bob综合游戏

Learn about atomic force microscopy and its materials characterization capabilities in this introductory e-book.

Download E-Book

Battery Research E-Book

This e-book introduces the main analytical techniques used to characterize Li-ion battery materials. In particular, it focuses on nanoindentation and atomic force microscopy characterization.

Download E-Book

The Latest Advances in AFM Nanoelectrical Modes

This e-book discusses the technology behind DataCube nanoelectrical modes, how they can be applied to perform hyperspectral mapping, and finally details several case studies.

Download E-Book

PeakForce Tapping Poster

Download your 24x36" print-ready poster. Printing instructions included.

Download Poster

Atomic Force Microscopy Covers the Landscape of Polymer Characterization

本文概述了Bruker的AFM显微镜和模式，用于纳米级聚合物的机械，电气和化学表征以及我们提供的工具，以支持驱动聚合物研究创新的相关显微镜。

Download White Paper

Browse Our AFM Library

News & Events

News & Events

Read the Latest News

New AFM Modes

Map of Vc+ created by collecting spectra at points in a 10x10 matrix

Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM)

Quantitative ferroelectric hysteresis loop measurement with highest sensitivity and accuracy

A new PeakForce Tapping add-on for compositional mapping

Ringing Mode

A new PeakForce Tapping add-on for compositional mapping

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客户支持

Service and Support

How Can We Help?

Bruker partners with our customers to solve real-world application issues. We develop next-generation technologies and help customers select the right system and accessories. This partnership continues through training and extended service, long after the tools are sold.

Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.

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