Due to their robust, environmentally friendly and cost-effective nature over other materials, polymers have become ubiquitous in research and manufacturing. Polymeric surfaces present in-homogeneities in microscopic scale, which can affect their properties of adhesion, wettability, abrasion and degradation in the environment, which has allowed them to be customized to suit a very wide range of uses. Atomic force microscopy has become a preferred technique for characterizing polymers. Some advantages are that it is not necessary to use vacuum during analysis or conductive covering on the samples; as well as the capability to direct measure height and roughness with atomic resolution. In addition, the AFM technique does not demand prior complex treatment of the sample for the characterization of the morphology, microstructure and crystallinity of different polymer films.
Bruker AFMS启用无损害的,以纳米分辨率的聚合物的原位成像(组成映射,动态行为的快速扫描)和专有Peakforcetapping®(最高分辨率成像,定量属性映射)。这些和其他纳米级表征技术涵盖了结构长度尺度的全部范围:
Nanoscale distribution of components or multi-phases is critical to polymer function. Physical AFM tip-sample interaction enables simultaneous detection of multiple sample properties. TappingMode phase imaging provides qualitative compositional mapping based on differences in material properties. Bruker's AFMs enable detailed characterization of:
Polymer dynamics range from intrinsic thermal behavior to interactions with the environment. Direct observation of structural changes can provide insights into key mechanisms and kinetics governing:
The tip-scanningFastScan AFMenables high-speed TappingMode imaging of dynamic behavior in real-time and real-space, independent of sample size and environment.
Certain polymer features, such as brush structure, chain-packing, and molecular/point defects, are difficult to image. Direct control of imaging force is critical to resolving these molecular and mesoscale structures.PeakForce Tapping即使在最小,最具挑战性的样品中,启用<100 pn力控制最高分辨率成像。由于这项技术与地形同时绘制了机械性能,因此通过这种专有技术,全面的理解更容易实现。
Mechanical performance of polymer materials critical to:
Microscopic organization requires characterization of Young’s modulus and stiffness at interphases/interfaces.PeakForce QNM®provides out-of-the-box quantitative elastic modulus mapping with nanometer resolution, enabling researchers to more easily and efficiently characterize polymers.
聚合物的粘弹性特性对于许多商业应用都是至关重要的,范围从振动隔离和噪声阻尼到休克吸收,耐污垢涂层以及依赖温度的要求。宏观的性质受纳米级结构的控制,例如相互重点,界面和域。需要时间温度叠加来充分理解粘弹性行为。
布鲁克的AFM-nDMA mode提供完全定量的粘弹性映射,包括存储和损失模量以及损失切线(与粘附区分开)。流变温度和频率范围可在纳米级的主曲线结构。
导电聚合物用于许多电子应用(例如有机光伏)。有机半导体的电荷运输特性和载体迁移与结构秩序水平直接相关。在多个长度尺度上绘制导电途径的能力是提高效率的关键。PeakForce-TUNAenables molecular-resolution, quantitative conductivity maps without damaging delicate samples. With this technology, researchers can now directly and reliably correlate topography and nanomechanical properties.