Cultural Heritage Under the Microscope: Getting to the Fine Detail with Advanced Elemental Analysis by Scanning Electron Microscope

High spatial resolution analysis by scanning electron microscopy is a fundamental part of the analytical workflow and essential to any complete investigation of art works and cultural heritage objects. Where investigation begins at the macro scale, non-invasive techniques such micro-XRF mapping allow SEM analysis to be conducted on the smallest samples taken with surgical precision to maximize outcomes. In addition, advances in detector technologies have made elemental characterization by SEM more rapid at higher sensitivity minimizing additional damage to valuable materials, while providing flexible configurations that are more accessible than ever.

This webinar will present examples of micro-analysis of cultural heritage samples using the SEM that illustrate the capabilities of the BrukerXFlash® detector range, including theXFlash^®FlatQUADannular SDD EDS detector, theQUANTAX CompactEDS detector for compact SEM platforms, and theXTrace in-SEM micro-XRF(QUANTAX Micro-XRF).