蚀刻和CMP的非破坏性计量学
Bruker的Insight Cap Automated Atomic Force Profiler是专门设计的,是用于半导体制造商和供应商的CMP和Etch Metrology的组合平台。灵活的配置可为晶圆尺寸从100毫米到300毫米,可为广泛的最终应用启用精确测量。从高生产力的实验室到完全自动化的Fabs,可以为最具成本效益的计量解决方案提供最佳配置的Insight Cap Profiler。
在先进技术节点,多重图像lithography techniques place nanometer-level process control requirements on CMP to meet depth-of-focus needs. InSight CAP is built around the latest generation AFM scanner to deliver improved flatness, less than 10 nanometers, over a 65 μm X / Y scan range. The system’s NanoScope® V 64-bit AFM controller offers 5x faster engage performance and 5x faster tuning for increased productivity, all with enhanced reliability. Its DT adaptive scan mode also contributes to faster scanning and improved metrology. With its combination of advanced features, the InSight CAP High-Resolution Profiler enables angstrom-level precision to measure in-macro dishing and erosion.
灵活的配置可为晶圆尺寸从100毫米到300毫米,可为广泛的最终应用启用精确测量。从高生产力的实验室到完全自动化的Fabs,可以为最具成本效益的计量解决方案提供最佳配置的Insight Cap Profiler。
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