Nanoscale Infrared Spectrometer

Dimension IconIR

Highest performance, large-sample nanoIR with PeakForce property mapping

Основные моменты

Dimension IconIR

力量的大样本维度IconIR系统梳理ines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications.

highest performance nanoIR spectroscopy
Provides increased flexibility and performance across sample types and applications.
chemical and nanoscale property mapping
Delivers quantitative nanochemical, nanomechanical, and nanoelectrical data.
photothermal AFM-IR imaging
Enables highest resolution characterization with monolayer sensitivity.


First-and-Only nanoIR Capabilities and Performance

In a single system, IconIR provides the highest performance for nanoscale infrared spectroscopy, chemical imaging resolution, and monolayer sensitivity.

Only Dimension IconIR delivers:

  • High-performance nanoIR spectroscopy with accurate and repeatable FT-IR correlation, <10 nm chemical resolution, and monolayer sensitivity
  • Correlative chemical imaging with PeakForce Tapping® nanomechanical and nanoelectrical modes
  • Highest Performance AFM imaging and unmatched sample flexibility with large-sample accommodation*
  • The broadest available range of coordinating applications accessories and AFM modes

*The standard system supports samples up to 150 mm, with versions capable of accommodating larger samples also available.

Most Complete Correlative Microscopy

Together with Bruker-exclusive PeakForce Tapping nanoscale property mapping and proprietary nanoIR spectroscopy technology, the Dimension IconIR system's large-sample platform is uniquely well-suited for correlative studies of materials and active nanoscale systems in electrical or chemically reactive environments—even complex systems with strong mechanical heterogeneities.

IconIR delivers:

  • Advanced quantitative property mapping techniques
  • The most complete correlative microscopy solution for quantitative nanochemical, nanomechanical, and nanoelectrical characterization
Nanochemical (AFM-IR) image of carbon fibers in epoxy resin.
Nanothermal (SThM) image of carbon fibers in epoxy resin.
Nanoelectrical (PF-KPFM) image of carbon fibers in epoxy resin.

Highest Performance NanoIR Spectroscopy

High-quality resonance-enhanced AFM-IR spectra collected at different sites on a PS-LDPE polymer blend, illustrating a high degree of material sensitivity and deeper insight into nanoscale material properties.

Bruker is the innovator for photothermal AFM-IR-based nanoIR spectroscopy with our patented, unique suite of nanoIR modes. These modes enable IconIR to provide high-speed, high performance spectra that correlate to FT-IR spectroscopy. The variety of modes support the measurement of a wide range of samples for both industrial and academic users.

IconIR delivers:

  • Highest performance, rich, detailed spectra with FT-IR correlation achieving single molecular spectroscopy
  • Resonance-enhanced AFM-IR, the preferred technique for the nanoIR community, with the largest number of scientific publications
  • Highest performance Tapping AFM-IR spectroscopy equivalent to Resonance-Enhanced AFM-IR

Highest Resolution Chemical Imaging

The Icon’s industry-leading AFM performance and Bruker’s patented Tapping AFM-IR imaging together enhance the spatial resolution and sample accessibility of our nanoIR technology, extending its application to segments not currently addressed by the photothermal AFM-IR technique.

IconIR provides:

  • <10 nm chemical spatial resolution for imaging over a broad range of sample types, including soft samples
  • Monolayer sensitivity for imaging of thin films and biological structure
  • Consistent, reliable, and high-quality publishable data
  • Reliable surface sensitive chemical measurements for polymeric films
High-resolution chemical imaging of PS-b-PMMA block copolymer in Tapping AFM-IR mode showing sample topography (a); IR images at 1730 (b); and 1492 cm-1 (c) highlighting PMMA and PS, respectively. The yellow arrows in panel (b) indicate chemical resolution <10 nm. The overlay image (d) captures the composition map.


Дополнительная информация


Contact Us

* Please fill out the mandatory fields.

Please enter your first name
Please enter your last name
Please enter your e-mail address
Please enter your Company/Institution
What best describes your current interest?
Please add me to your email subscription list so I can receive webinar invitations, product announcements and events near me.
Please accept the Terms and Conditions

Этот сайт защищен reCAPTCHA, и применяютсяПолитика конфиденциальности ииУсловия использованияGoogle.