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力量的大样本维度IconIR系统梳理ines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications.
Características
First-and-Only nanoIR Capabilities and Performance
In a single system, IconIR provides the highest performance for nanoscale infrared spectroscopy, chemical imaging resolution, and monolayer sensitivity.
Only Dimension IconIR delivers:
- High-performance nanoIR spectroscopy with accurate and repeatable FT-IR correlation, <10 nm chemical resolution, and monolayer sensitivity
- 使用PeakforceTapping®Nanomenolical和Nanoelectrical模式的相关化学成像
- 最高性能AFM成像和无与伦比的样品灵活性，并具有大样本住宿*
- 最广泛可用的协调应用程序配件和AFM模式
*标准系统支持高达150毫米的样品，并且还可以容纳较大样品的版本。
最完整的相关显微镜
Together with Bruker-exclusive PeakForce Tapping nanoscale property mapping and proprietary nanoIR spectroscopy technology, the Dimension IconIR system's large-sample platform is uniquely well-suited for correlative studies of materials and active nanoscale systems in electrical or chemically reactive environments—even complex systems with strong mechanical heterogeneities.
Iconir提供：
- 高级定量属性映射技术
- 用于定量纳米化学，纳米力学和纳米电特性的最完整的相关显微镜解决方案
Highest Performance NanoIR Spectroscopy
布鲁克（Bruker）是光热基于AFM-IR的纳米光谱的创新者，具有我们专利的独特纳米模式套件。这些模式使Iconir能够提供与FT-IR光谱相关的高速高性能光谱。各种模式支持工业用户和学术用户的广泛样品的测量。bob娱乐平台
Iconir提供：
- Highest performance, rich, detailed spectra with FT-IR correlation achieving single molecular spectroscopy
- 共鸣增强的AFM-IR，这是纳米社区的首选技术，科学出版物数量最多
- Highest performance Tapping AFM-IR spectroscopy equivalent to Resonance-Enhanced AFM-IR
Highest Resolution Chemical Imaging
该图标的行业领先的AFM Performance和Bruker获得专利的攻击AFM-IR成像，共同增强了我们的纳米技术的空间分辨率和样品可访问性，将其应用扩展到光热AFM-IR技术目前未解决的细分市场。
Iconir提供：
- <10 nm化学空间分辨率用于在广泛的样品类型上成像，包括软样品
- Monolayer sensitivity for imaging of thin films and biological structure
- Consistent, reliable, and high-quality publishable data
- 可靠的表面敏感化学测量聚合物膜
