Nanostar
纳米学-SAXS-蜡 - Gisaxs
Основные моменты
The NANOSTAR with its incomparable modularity is the ideal tool for characterization of nanostructures and nanostructured surfaces by Small-Angle X-Ray Scattering (SAXS), Grazing-Incidence Small-Angle X-ray Scattering (GI-SAXS), Wide-Angle X-Ray Scattering (WAXS), and Nanography. The mirror-conditioned pinhole collimation system produces a parallel, ideal circular beam shape with high intensity and low parasitic scatter. The extra-large (XL) sample chamber accommodates a variety of dedicated and 3rd party sample stages for measurements of many sample types under all conditions. Finally the scattered signal is collected with a large, low background, highly sensitive 2D detector for isotropic and anisotropic samples.
Market Gallery
胶体
Metals
聚合物
Nanostructured Surfaces
Особенности
我µS micro focussource
This unique X-ray source supplies a very stable and intense spot-focus X-ray beam without the need for water cooling. Thanks to its robust design, the source comes with a 3-year warranty. The IµS includes integrated MONTEL, state-of-the-art 2-D beam-shaping optics, for highest intensity on the sample. This side-by-side multilayer mirror design captures a large solid-angle of x-ray from the source and efficiently redirects in a highly parallel and monochromatic beam.
XL Sample Chamber
This conveniently oversized (XL) sample chamber comes with many extra feed-through ports and can be operated under vacuum, inert gas, or atmospheric conditions. It can accommodate many additional standard components for individualized handling of multiple samples as well as 3rd party and custom stages for maximum visibility. A motorized X-Y stage with large translation range and secondary motorized reference sample holder wheel make automated sample alignment and reference and background scans a snap!
Våntec-500 2D检测器
带有Mikrogap的Vantec-500 2-D检测器TM值技术满足专用SAXS系统的所有理想要求。首先，不需要气体，水或常规维护，也不需要对强烈的辐射或运动损伤的疑虑导致探测器强大且易于使用。一个大的活跃区域（直径14厘米），以使巨大的角度覆盖范围具有完整的视野。令人难以置信的低背景和高最大计数率，对于奇妙的动态范围和对弱散射样品的敏感性。出色的空间分辨率来解决紧密间隔的散射特征。没有其他探测器可以为这些应用提供这些理想功能的组合。
Feature Gallery
我µS micro focussource
XL SAMPLE CHAMBER
Våntec-500 2D检测器
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关键应用程序
小角度和广角X射线散射（SAXS和蜡）
Small Angle X-ray Scattering (SAXS) is a phenomenon caused by particles embedded in a matrix of different electron density. If the particle size ranges from 1 nm to 200 nm, the scattering angle lies within the range of 0° to 5°, depending on the X-ray wavelength used. The smaller the particles are, the wider are the scattering angles.
在任何介质中的任何排列都显示出电子密度的差异，这在执行SAXS实验时会导致特定模式。除了颗粒的尺寸外，萨克斯州还可以确定它们的形状，分开的距离以及与2-D模式的尺寸分布。颗粒可以溶解大分子，金属中的降水量，生物组织中的矿物颗粒和表面活性剂胶束。
与SAX相比，广角X射线散射（蜡）检查了埃埃斯特罗姆水平的结构，这些结构通常是晶体结构的间距离。通常，蜡用于分析Bragg X射线衍射（XRD）图案，该图案可以帮助确定晶体结构，结晶度，结晶石大小和相组成（相位ID）。可以同时（同时）将蜡数据收集，因为SAXS数据具有第二个检测器的位置更接近样品。
放牧的萨克斯（GI-saxs）
To probe the surface and subsurface structural details, samples are measured in grazing incidence geometry. The incident angles are close to the so-called critical angle of total reflection and typically lie between 0.1 and 0.7 degrees. In a Grazing Incidence Small Angle X-ray Scattering (GISAXS) experiment, the diffusely scattered intensity is collected in the non-coplanar direction by means of a 2-D detector.
具有电动倾斜的专用GI-SAXS阶段用于对齐梁中的样品。
纳米学
一项纳米学研究利用了集成到纳米级样品室的运动驱动的XY阶段。这允许将样品的选定区域自动通过X射线梁进行扫描。然后可以通过颜色编码的轮廓图显示强度分布（或其他散射参数）。
纳米学允许使用不均匀样品快速和选择性地检测相关的测量点，并允许精确定位小样品。完整纳米摄影图像的每个点本身代表了2-D收集的积分SAXS/蜡强度。
Application Gallery
SAXS: PVDF
纳米学：木片
SAXS: Micellar samples
SAXS: Collagen fiber
Спецификации
NanostarSpecifications
Feature |
Specification |
益处 |
我µS micro focussource |
气冷式,高强度,micro focus x射线酸ce |
Low power usage (30W) 3年标准保修 不需要水冷却器 High power density leads to increased intensity Integrated Montel mirrors for ideal beam conditioning |
SCATEX pinholes |
Ideal circular beam shape with negligible parasitic background scatter. |
No parasitic aperture edge scattering 较高的分辨率 /更高的通量 More compact collimation beampath allows longer detector distance 简单，稳定，针孔对齐 |
XL Sample Chamber |
Extra-Large chamber, with motorized XY-stage for sample positioning, mapping and accommodation of versatile standard and 3rd party stages. |
内部尺寸：287毫米x 501毫米x 380毫米（w x h x d） Flanges for additional supply connections XY-stage with 80 mm x 130 mm translation Motorized reference sample wheel Operation in vacuum, air, or inert gas atmosphere |
Våntec-500 2D检测器 |
Large active area, low background, high sensitivity 2D detector |
全框架萨克斯/蜡散射图像的大型活性区域（直径14厘米） 最高灵敏度的背景非常低 出色的空间分辨率（68微米像素尺寸） Maintenance-free (no water/air required or sensitivity to strong primary beam or detector movement under bias) |
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NANOSTAR资源
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