NANOSTAR

The NANOSTAR with its incomparable modularity is the ideal tool for characterization of nanostructures and nanostructured surfaces by Small-Angle X-Ray Scattering (SAXS), Grazing-Incidence Small-Angle X-ray Scattering (GI-SAXS), Wide-Angle X-Ray Scattering (WAXS), and Nanography. The mirror-conditioned pinhole collimation system produces a parallel, ideal circular beam shape with high intensity and low parasitic scatter. The extra-large (XL) sample chamber accommodates a variety of dedicated and 3rd party sample stages for measurements of many sample types under all conditions. Finally the scattered signal is collected with a large, low background, highly sensitive 2D detector for isotropic and anisotropic samples.

这种独特的X射线源可提供非常稳定和强烈的斑点X射线梁，而无需进行水冷却。得益于其强大的设计，该消息来源具有3年的保修。IµS包括集成的MONTEL，最先进的2-D光束成型光学元件，以最高强度。这种并排的多层镜设计可从源捕获大的X射线固体角度，并在高度平行和单色梁中有效地重定向。

The VANTEC-500 2-D detector with Mikrogap^TM理想的技术满足所有需求of a dedicated SAXS system. First, no need for gas, water, or routine maintenance and no concerns for intense radiation or movement damage results in detector that is robust and very easy to use. A large active area (14 cm diameter) to enable huge angular coverage with full field of view. Incredibly low background and high maximum count rate for fantastic dynamic range and sensitivity to weakly scattering samples. Excellent spatial resolution to resolve closely spaced scattering features. No other detector can offer these combination of ideal features for these applications.

小角度X射线散射（SAXS）是由嵌入不同电子密度基质中的颗粒引起的现象。如果粒径范围从1 nm到200 nm，则散射角位于0°至5°的范围内，具体取决于所使用的X射线波长。颗粒越小，较宽的是散射角。

Any arrangement of particles in any medium shows a difference in electron density, which results in a specific pattern when executing a SAXS experiment. Along with the size of the particles, SAXS can also determine their shape, their distance apart and size distribution from the 2-D pattern. Particles can be dissolved macromolecules, precipitations in metals, mineral particles in biological tissues, and surfactant micelles.

In contrast to SAXS, Wide Angle X-ray Scattering (WAXS) examines structures on the Angstrom level, which are typically interplanar distances of crystalline structures. Often WAXS is used to analyze Bragg the X-ray diffraction (XRD) pattern which can help determine crystalline structure, degree of crystallinity, crystallite size, and phase composition (Phase ID). WAXS data can be collected at the same time (simultaneously) as SAXS data with a 2nd detector positioned much closer to the sample.

A Nanography investigation utilizes the motor-driven XY stage integrated into the sample chamber of the NANOSTAR. This allows a selected region of the sample to be scanned through the X-ray beam automatically. The intensity distribution (or other scattering parameter) can then be displayed by means of a color-coded contour plot.

Nanography permits fast and selective detection of relevant measuring points with inhomogeneous samples and allows even small samples to be positioned precisely. Each individual point of the complete Nanography image itself represents the integral SAXS/WAXS intensity collected by the 2-D.