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用于自动纳米测量学和表征的原子力显微镜
The Dimension® family of Atomic Force Microscopes (AFMs) have a long-standing reputation for providing the highest available speed and performance for industrial metrology applications. Designed specifically for high-volume, production environments, Dimension HPI and PRO systems enable automated measurements of many AFM modes while ensuring the utmost ease of use and the lowest cost per measurement for quality control, quality assurance, and failure analysis. Using contact, tapping, and PeakForce Tapping® mode techniques, these systems enable users to precisely control probe-to-sample interaction, providing long tip life-times with high-accuracy results in thousands of measurements.
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