电子显微镜分析仪

QUANTAX EBSD

On-axis TKD for Unmatched Performance

最佳空间分辨率

低探头电流需求

Najważniejsze informacje

1.5
nm
有效的空间分辨率
Unique on-axis TKD offers optimum sample-detector geometry resulting in unmatched performance
2
nA
所需的最大探测电流
On-axis TKD enables low probe current measurements without affecting speed and data quality
125,000
pps
Ultrafast acquisition of FSE, BSE & STEM images
High contrast & low noise imaging within seconds enabled by unequaled ARGUS imaging system

Orientation Mapping of Nanomaterials with Unmatched Spatial Resolution

QUANTAX EBSD system, with its popularOPTIMUS 2检测器头是分析SEM中纳米材料的最佳解决方案。bob综合游戏这就是为什么:

  • 提供最佳的空间分辨率降至1.5 nm
  • operates with low probe currents without compromising speed and/or data quality
  • the only TKD solution working in Ultra-High Resolution mode of SEMs using immersion lens technology
  • fully automatic, built-in阿格斯成像系统

Korzyści

为什么我需要轴心tkd?

We would like to thank Aaron Lindenberg and his group at Stanford University for the permission to publish this DF-like image of their Ge-Sb-Te (GST) thin film sample!
  • To achieve the best spatial resolution
  • 用于SEM中的方向和相位映射
  • 用于快速映射而不损害数据质量/完整性
  • For acquisition of STEM like images with excellent contrast and resolution at incredible speeds and with fully automatic signal optimization
  • 用于使用低探头电流分析光束敏感材料。bob综合游戏

Więcej informacji

Resources & Publications