XFlash 6-100 oval
The High Collection Angle Windowless EDS System for SEM, FIB-SEM and STEM-in-SEM
This large area, high collection angle, windowlessEDSdetector with an oval-shaped 100 mm2SDD is carefully customized for the specific geometry in SEM. The unique shape and state of the art slim-line design allow to optimize the acquisition position achieving a solid angle for X-ray collection of up to 0.4 sr without compromising the SEM performance.
In summary, the XFlash®6-100 oval offers the following advantages:
- 100 mm2area, windowless
- Solid collection angle up to 0.4 sr, adaptions vary
- Maximum accelerating voltage on all SEM types: 30 keV
- Take-off angle of typically 30° … 35°
- Welded bellows and X-ray-tight shutter (optional)
- Non-interfering cooling system
- Automatic detector retraction system
- Excellent light element and low energy performance
- All advantages of Bruker’s versatileanalysis software
Suggested areas of application for the XFlash®6 - 100椭圆是:
High-end element analysis by EDS in SEM, FIB-SEM and STEM-in-SEM aiming at:
- Low kV and beam sensitive samples
- Light element analysis
- High spatial resolution
- Fast data acquisition