Ceramics and Inorganic Coatings

FTIR spectroscopy可用于层厚度 -确定此类电影。For smaller structures in the米icrometer range, FTIR microscopes provide excellentresults and enable reliable layer thickness determinations.

This is done, by using reflection measurements on the optically transparend diamond. This leads toso-called interference-induced fringes. These arecaused by light being reflected both from the surface of thecoating layer and from the substrate below the coating.

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To make it short,Raman spectroscopyis one of the most powerful toolsfor carbon allotrope analyses.Naturally, it is the go-to-tool for chemical vapor deposited diamond-like carbon.

It allows differentiating thenumerous carbon types and provides essential structuralinformation, e.g. the important sp²/sp³ratio. Furthermore,Raman microscopy is able to acquire Raman spectra in thesubmicrometer range.

• Coating uniformity evaluation
• Insights into coating process
• Comprehensive carbon allotrope studies

Metal coatings are essential to many industrial sectors by providing enhanced surface properties to a wide variety of products. The metal coatings can provide a durable, corrosion-resistant layer to protect the base material, and help to minimize the wear and tear of metallic products. Metallic coatings can improve electrical conductivity, resistance to torque, solderability among other things. The quality control of composition and thickness of coatings is critical to ensure the correct coating properties and durability.

When tight quality control of metal coatings is required, X-ray fluorescence (XRF) analysis is the best overall solution. The BrukerM1 MISTRAL米icro-XRF instrument can provide simultaneous coating thickness and coating composition measurements. In addition to coating analysis, theM1 MISTRALcan also measure the chemical composition of metal alloys, plating bath liquids, plastics and many other materials.

As X-rays may pass through matter, XRF in general allows for the determination of layer thicknesses. Using米icro-XRF, in this case theM4 TORNADO, the layer analysis (thickness and composition) is rendered feasible with spatial resolutions on the micrometer scale. Layer analysis is strongly based on atomic fundamental parameter quantification and can be improved by use of standard samples. Thus "common" layer systems, such as ENEPIG coatings, ZnNi coatings, or solder layers, where standards are readily available can be measured with high accuracy but also novel layer systems in an R&D environment can be tested.

The analysis of thin layers or coatings is a common task in米icro-XRF spectrometry.Both the non-destructive operation of the method and the ability of X-rays to penetrate into sample and obtain information on the material beneath the surface make this method attractive for the purpose of analyzing single or multiple layers.

分析此处讨论的样品的特殊挑战是，层（铝）和底物（硅）都是光元素，需要在真空下进行测量，否则样品和检测器之间的光束路径中的空气会吸收由低能辐射吸收的低能辐射。样品。此外，此应用程序还使用自动点比较手动和自动分析。结果表明，可以准确地确定层厚度米icro-XRF(M4 TORNADO) , which is confirmed by comparison with direct measurement results on a layer fracture edge in the scanning electron microscope.

大多数加工步骤都会引入残留应力，这些应力可能会影响制造成分的性能。压缩应力可以设计成金属涂层以抵抗裂纹繁殖，而拉伸应力可以被利用以提高半导体的电导率。应变的材料表现出可bob综合游戏通过X射线衍射（XRD）检测到的原子间距的变化，并通过弹性常数与应力有关。