QUANTAX EDS for TEM

Punti salienti

>15

years

Experience with silicon drift detectors in TEM

Detector materials and driving electronics are designed for fast, precise and reliable data acquisition and no interference with high-end TEM performance, even at atomic resolution.

80

keV

Unprecedented upper energy limit for element ID and quantification

With TEM-specific high energy electrons and thus higher energy element lines for quantitative EDS

1

atom

Single atom ID and atom column mapping

Single atom identification within seconds using the high solid angle XFlash 6T detectors in combination with high end high brightness cold FEG aberration corrected STEM

EDS Element Mapping in TEM, STEM and SEM (T-SEM) on the Nanometer Scale

The clear versatile measurement setup and slimline geometry ensure fast reliable TEM EDS data on a routine basis. Hyperspectral images are acquired using so-called HyperMaps or Spectrum Images. Spectra per pixel and all meta-data needed for correct quantitative analysis are saved for inspection and processing.

Slim-line design and geometrical optimization for each microscope pole piece type ensure maximum collection and take-off angle.
Helps avoid specimen tilt, absorption, shadowing and system peaks.
Windowless detectors for further increase of detection efficiency, particularly in the low energy region for K-lines of light elements and L-, M- and further lines of higher Z-elements.
Auto-retraction by default and customization ensure long detector life time and versatile experiments.
Automatic monitoring of in-situ and in-operando experiments, such as heating of materials, where chemical changes are recorded in real time.
Comprehensivesoftware suite ESPRIT在线和离线数据分析。

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Benefici

Software for On- and Off-line TEM EDS

QUANTAX EDS对TEM包括一个灵活和透明arent analysis software packageESPRIT. Default and adjustable methods allow fast and comprehensive data mining of element mappings, so-called HyperMaps or spectrum images and the generation of quantitative element maps. Standard based and standardless quantification routines for spectra, objects, line scans and element mapping are included as well as PCA based phase analysis and automated statistical partical analysis.

Off-line analysis software with personal hardware-key and/or LAN option for student or laboratory networks.
Open transparent user interface: what you see is what you get.
Clear setup, modification and save/reload of quantification routines for EDS data.
Two quantification methods for electron transparent specimens: Cliff-Lorimer- and Zeta-Factor-Method.
Theoretical Cliff-Lorimer Factors can be calculated for any voltage, including low voltages on SEM (TEM in SEM), using a large steadily updated atomic data base.
Easy software-guided calibration of experimental Cliff-Lorimer- and Zeta-Factors using standard specimens.
Zeta-factors for all elements can be calculated from only a few element standards using the existing Cliff-Lorimer-Factors.
Choice of background models: physical models for electron transparent and bulk specimens, as well as mathematical background calculation.
Report generation with different templates.