Contour Elite X
Highlights
Contour Elite X
The fully automated, large-sample Contour Elite X 3D Optical Profiler combines unmatched measurement capabilities with highest vertical resolution over the industry’s largest field of view and high-fidelity color or monochrome imaging. No other metrology system provides the non-contact accuracy, throughput, operator convenience, and imaging capabilities to address such a vast range of production metrology applications. Designed from the ground up for the most demanding R&D, quality assurance, and process quality control needs, the Contour Elite X offers the ultimate gage-capable 3D optical profiling solution.
eigenschaften
颜色成像和计量学结合
高保真彩色成像,exclusive side illumination and advanced algorithms, gives Contour Elite X users access to additional perspectives not possible on systems that provide metrology alone, as well as the capability to provide recognizable surface feature details for reporting. This enables users to segment data based on color or grayscale information to rapidly select areas of interest and collect critical metrology data from these specific regions. Combining high-end metrology with the ability to see, recognize, and display what was measured is of great importance, not only for understanding the data, but also for communicating the results.
最佳横向和垂直分辨率
Contour Elite X系统具有在该行业最大的视野上最好的组合横向和垂直分辨率，其子纳米计至垂直范围超过10毫米。它包括R＆D 100屡获殊荣的AcuityXR测量技术，该技术提供了打破光学测量中衍射极限的能力。此外，系统可以利用增加X-Y空间分辨率的百万像素摄像头。从1x到115倍的巨大视野和客观的宏伟，可以表现出极为广泛的表面形状和纹理。
快速，无损成像
The Contour Elite X profiler is a non-contact system with a large stage that leaves your samples or parts intact and undamaged. Our patented white light interferometry (WLI) technology acquires height data with sub-nanometer precision that is independent of the magnification used. This means that, even when sampling over a million data points in a millimeters-squared image area, a user is able to collect high-resolution height data—all within a few seconds.
