TEM Picoindenter系列

Hysitron Pi 95

Quantitative nanomechanical testing inside your transmission electron microscope
Hysitron Pi 95TEM PicoIndenter

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In-Situ Nanomechanical Test Instrument

Hysitron Pi 95TEM PicoIndenter

Bruker的Hysitron Pi 95 TEM Picoindenter是第一个完整的深度感应凹痕器,能够在透射电子显微镜(TEM)内进行直接观察纳米力学测试。使用该侧入仪器,不仅可以对纳米级材料的机械响应进行成像,而且可以同时获取负载解散数据。bob综合游戏此外,集成的视频接口允许在负载解散曲线和相应的TEM视频之间进行时间同步。

Full-fledged
深度感应缩进器
启用传输电子显微镜内部的直接观察纳米力学测试。
Performech
高级控制模块
提供78 kHz的反馈率和数据采集高达38 kHz,以捕获瞬态事件,例如位错爆发。bob综合客户端app
精确的
提示位置和机械测试
包括三轴定位器,3D压电执行器和用于静电致动和电容式位移感应的高级传感器。

Особенности

Customized Solution for Your TEM

The Hysitron PI 95 has been carefully designed for compatibility with JEOL, FEI, Hitachi, and Zeiss microscopes. With this instrument it is not only possible to image the mechanical response of nanoscale materials, but also acquire quantitative mechanical data simultaneously. The integrated video interface allows for synchronization between the load-displacement curve and the corresponding TEM video.

针对纳米级调查进行了优化

Dark-field TEM images of a Ni nanopillar before and after compression. The high dislocation density initially observed in the pillar has disappeared upon compression. Nature Materials 7, 115-119 (2007).

Hysitron Pi 95独特地适合研究纳米级现象。在TEM中进行这些类型的研究可以在许多可能的力或位移瞬变原因之间提供明确的分化,这些瞬变可能包括位错爆发,相变,剥落,剪切带或断裂发作。

无与伦比的性能

一个示例1μn刮擦测试:(1)正常和横向载荷和位移与时间与(2-5)来自原位tem视频的相应帧,显示了在尖端之前屈曲DLC膜的屈曲,并呈浅色的变化。在谷物的顶部。

The Hysitron PI 95 utilizes three levels of control for tip positioning and mechanical testing. In addition to a three-axis coarse positioner and a 3D piezoelectric actuator for fine positioning, the instrument is equipped with a transducer for electrostatic actuation and capacitive displacement sensing for acquiring quantitative nanoscale mechanical data.

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дополнительнаяÖB

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