QCVELOX-E
System of choice for leading epi manufacturers
The essential tool for routine analysis of semiconductor substrates, epilayer structures and processed device wafers.
Основные моменты
QCVELOX-E
Bruker Qcvelox-E是领先的EPI制造商监视其生产线的首选系统。它基于行业标准QC3，其吞吐量，可靠性和易用性进行了重大升级。通过使用最佳的X射线源和光学技术，它可以将高通量与出色的可重复性相结合，从而可以在生产环境中快速反馈层质量和结构。
Особенности
Automated Operation
The QCVelox-E offers true automated operation, with straight-forward horizontal sample mounting, and fully automated alignment, measurements including full mapping without edge exclusion, and automated data analysis. An integrated barcode reader is fitted to aid productivity within a production environment.
可选的机器人处理程序可用于盒式磁带的自动加载和测量，以及SECS-GEM和其他工厂主机系统的选项。
QCVELOX-E是用于所有复合半导体材料的半导体底物，表层结构和加工设备晶片的常规分析的必要工具。bob综合游戏
Поддержка
支持
How Can We Help?
Bruker与我们的客户合作解决了现实世界中的应用程序问题。我们开发下一代技术，并帮助客户选择正确的系统和配件。在工具出售工具很久之后，这种合作伙伴关系继续通过培训和扩展服务。bob电竞官方网站
Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.