Dimension Icon-Raman
Основные моменты
Dimension Icon-Raman
图标AFM-Raman系统汇集了原子力显微镜和拉曼显微镜的免费技术，以提供有关样品的地形和化学组成的关键信息。当这些技术通过先进的AFM模式进一步增强时，例如Bruker-Cemprepusive peakforce tina™电气表征和PeakForce QNM®quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.
Особенности
Configuration Stability and Flexibility
The AFM-Raman system, consisting of theDimension Icon®AFM研究级共聚焦拉曼显微镜（Horiba，Labram）都位于一个刚性，抗振动平台上。这种配置允许系统维护每个仪器的完整功能，从而提供最佳的组合性能。例如，Confi Guration可以完整补充图标升级，AFM模式和易用功能，包括Bruker-oftecusive scanasyst®. You are able to tailor the most effective combination of modes for your application.
Seamless Technique and Analysis Integration
Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features. Raman mapping and imaging results can easily be correlated with AFM images using MIRO®, Bruker’s powerful microscopy overlay software. Stacks of data sets (topography, modulus and adhesion maps) can be overlaid with a chemical distribution map to provide comprehensive correlated information of the inspected surface area.
Применения
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.
Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.
Icon-Raman Data Gallery
