光学CMM机器以测量紧密公差
µCMM
µCMM, the first purely optical CMM machine, is used to measure extremely tight tolerances in high accuracy. Users combine advantages from tactile coordinate measuring technology and optical surface measuring technology and measure the dimension, position, shape and roughness of components with only one sensor. The optical CMM offers high geometric accuracy of several optical 3D measurements in relation to each other, enabling the measurement of small surface details on large components and precisely determining the position of these individual measurements in relation to each other. The spectrum of measurable surfaces includes all common industrial materials and composites such as plastics, PCD, CFRP, ceramics, chrome, silicon. Simple operation is implemented by single-button solutions, automation and ergonomic control elements such as a specially designed controller. Air-bearing axes with linear drive enable wear-free use and highly accurate, fast measurements.
eUNI:TR:ODS,MPE= (0.8 + L/600) μm
eUniZ:St:ODS,MPE=(0.15 + l/50)µm
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Technical Specifications | µCMM
Measurement principle | 非接触,光学,三维,基于焦点变化。垂直焦点探测技术 |
Number of measurement points | Single measurement: X: 1720, Y: 1720, X x Y: 2.95 million 多测量:最多5亿 |
定位量(x x y x z) | 310毫米x 310 mm x 310 mm = 29 791 000mm³ |
Travel speed of axes | Up to 100 mm/s |
同轴照明 | LED同轴照明(颜色),高功率,电子控制 |
系统监控 | 9 temperature sensors (accuracy: ± 0.1 K), 3 vibration sensors, internal current and voltage monitoring, incl. long-term logging, retrievable |
3D精度10360-8给出的值基于ISO 10360-8和VDI 2617 | eUNI:TR:ODS,MPE= (0.8 + L/600) μm (L in mm)Axis accuracy based on ISO 10360-8. eUniZ:St:ODS,MPE= (0.15 + L/50) μm (L in mm)对于单个测量,高度步骤测量有效 |
Objective | 3000WD8 | 1900WD30 | 1500WD23 | 1500WD70 | 800WD17 | 800WD37 | 400WD19 | 150WD11 | |
Working distance | mm | 8.8 | 30 | 23.5 | 64.4 | 17.5 | 37 | 19 | 11 |
Lateral measurement range (X,Y) (x x y) |
mm mm² |
5.26 27.64 |
3.29 10.8 |
2.63 6.91 |
2.63 6.91 |
1。32 1。71 |
1。32 1。71 |
0。66 0.43 |
0.26 0.06 |
For more information download the product flyer or send us a request.
THE µCMM OFFERS
直观可用性,专为多个用户设计
可测量的表面的光谱主要独立于材料,并且包括行业中常用的所有材料和复合材料,从哑光到抛光或镜像组件。bob综合游戏
密集的非接触和材料无关的测量
ALICONA测量系统提供了表面和坐标测量系统的功能。结果,您的质量保证变得更具成本效益,更易于执行,并更有效地提供结果。
无磨损和高效使用
All components, including the moving axes, operate contact-free. Air-bearing linear drive axes enable wear-free operation and highprecision, fast measurement. This makes μCMM ideal for permanent use in production.
新软件Metmax
从“我如何衡量?”要“我该测量什么?”
焦点变化技术
Alicona测量系统基于焦点变化的技术,并结合了表面粗糙度测量设备和形式测量系统的功能。每种Alicona测量仪器都是表面测量设备,表面粗糙度测量系统,用于几何耐受和微坐标测量系统的3D测量系统。The Focus-Variation technology combines the小景深光学系统的版本tical scanning to provide topographical and color information from the variation of focus。系统的主要组件是一个精确的光学器件,其中包含各种镜头系统,这些系统可以配备不同的目标,从而允许测量不同的分辨率。
有关光学CMM的更多信息:
Webinar
Opening new doors for production measurement technology
了解最准确的纯粹光学微型坐标测量系统µCMM的技术规格和计量特征。
Watch Webinar>>>
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第一个光学坐标测量机上的10个问题
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