Press Release Details

System features new PeakForce IR SPM Mode for Comprehensive Nanocharacterization

马萨诸塞州比勒里卡。--(BUSINESS WIRE)-- Bruker(NASDAQ: BRKR) today announced the release ofInspire™, the first integrated scanning probe microscopy (SPM) infrared system for 10-nanometer spatial resolution in chemical and materials property mapping. The new and uniqueInspiresystem incorporates Bruker’s proprietaryPeakforce ir™mode to enable nanoscale infrared reflection and absorption mapping for a wide range of applications, including the characterization of microphases and their interfaces in polymer blends, plasmons in the two-dimensional electron gas of graphene, and chemical heterogeneity in complex materials and thin films.

TheInspire系统具有对分子单层的灵敏度，即使在不适合标准原子力显微镜技术的样品上。Inspire利用完全集成的红外散射，扫描近场光学显微镜（SNOM）光学元件，点击对齐以及全套独家套件Peakforcetapping®从布鲁克（Bruker）的性能领先AFMS中找到的技术，ScanAsyst®self-optimization to quantitativePeakForce QNM®nanomechanics andPeakForce KPFM™work function measurements. The resultingInspiresolution now provides instant access to the highest resolution chemical, plasmonics, nanomechanical, and electrical characterization for new scientific research and nano-analytical frontiers.

“The infrared scattering SNOM technique has great potential for new scientific discoveries through highest resolution spatio-spectral imaging,” explained Professor Markus B. Raschke，物理和化学部门，以及Jila，在 科罗拉多大学博尔德. “Its wide, productive application has been held back by the lack of an integrated solution.”

“WithInspire，我们现在提供了这种集成的解决方案，这是我们通过向研究人员提供新的纳米级化学信息来实现更广泛采用AFM的道路的主要里程碑。” David V. Rossi的执行副总裁和总经理 Bruker'sAFM Business. “Inspirebuilds upon our exclusivePeakForce Tappingtechnology to provide a complete set of the highest resolution nanochemical and nanomechanical property maps together with topography in a single SPM measurement.”

About Inspire

Inspireis a scanning probe based nanoscale characterization system that extends atomic force microscopy into the chemical regime by providing infrared absorption and reflection imaging down to a spatial resolution of 10 nanometers utilizing scattering scanning near-field optical microscopy (SNOM).Inspireincludes all optics, detectors and configurable sources, as well as all AFM hardware and software for atomic resolution imaging in a compact and robust integrated package.Inspirealso comes with Bruker’s newPeakForce IR模式，基于布鲁克的独家PeakForce Tappingdirect force control technology.PeakForce IRovercomes the limitations of contact and ofTappingMode™, and thus of traditional near-field optical and photothermal approaches to nanoscale infrared imaging. It also avoids sample damage from lateral forces, retaining highest resolution on soft polymers, and enables high-resolution imaging of polymer brushes and even powders.PeakForce IRincludesScanAsystself-optimization andPeakForce QNMfor instantly correlated nanomechanical data. The comprehensive set of optional modes includesPeakForce TUNA™,which enables conductivity mapping on samples not amenable to contact mode AFM, andPeakForce KPFM，它采用FM检测来进行最高的空间分辨率工作函数映射，同时避免了影响单pass FM-KPFM的机械串扰。

About Bruker Corporation

Bruker Corporationis a leading provider of high-performance scientific instruments and solutions for molecular, cellular and materials research, as well as for industrial, diagnostics, clinical research and applied analysis. For more information about Bruker Corporation， 请拜访www.energie2point0.com.

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资源： Bruker Corporation