Hysitron PI 85E
伪造的侯爵夫人
Hysitron PI 85E SEM PicoIndenter
The Hysitron PI 85E SEM PicoIndenter extends the range of your in-situ mechanical testing, bridging the gap between nanoscale and microscale characterization. This depth-sensing nanomechanical test system is specifically designed to leverage the advanced imaging capabilities of scanning electron microscopes (SEM, FIB/SEM, PFIB) while simultaneously performing quantitative nanomechanical testing. Its extended force range enables researchers to accurately test dimensionally large and/or hard structures that require larger loads to induce failure and/or fracture. The PI 85E instrument offers indentation, compression, tension, and fatigue testing across the entire materials spectrum (from metals and alloys to ceramics, composites, and semiconductor materials). The compact, low-profile architecture of PI 85E makes it ideally suited for small-chamber SEMs, Raman and optical microscopes, beamlines, and more.
Caractéristiques
Nanoindentation: High-Precision In-Situ Mechanical Testing
表征硬度，蠕变，应力松弛，弹性模量和近表面特征，接口，局部微观结构和薄膜的断裂。
Behavior Exploration with Extended Range
Hysitron PI 85E结合了各种测试模式，以表征基本的机械性能，应力 - 应变行为，刚度，断裂韧性和各种样品的变形机制。除了Bruker的行业标准测试传感器外，PI 85E还具有更高的负载（250 MN）和较大的位移（150 µm）功能。具有高级控制电子设备的高带宽传感器和挠曲，完全优化了大规模样品测试，并提供出色的性能和灵敏度。
一，二维和三维纳米结构的表征
Hysitron Pi 85E系统使用专利Push-to-Pull (PTP)devices to characterize one-dimensional structures, such as nanowires and nanotubes, and two-dimensional structures, such as free-standing thin films. These structures can also be electrically characterized with the instrument's optional Electrical Push-to-Pull devices. The larger displacement range of PI 85E is also ideal for testing deformation of three-dimensional lattices to larger strain.
