D8 ADVANCE Plus

The D8 ADVANCE Plus is a D8 ADVANCE variant representing the ultimate X-ray platform for multi-purpose, multi-user laboratories. The system perfectly matches the needs of all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial):

• traditional X-ray powder diffraction (XRD)
• Pair Distribution Function (PDF)analysis
• Small and Wide Angle X-ray Scattering (SAXS, WAXS)
• XRR (reflectometry) and HRXRD (rocking curves, reciprocal space mapping)
  在环境和非事实条件下。

The real beauty of the system is its ability to switch between up to 6 different beam geometries, from focusing Bragg-Brentano geometry for powders to high-resolution parallel-beam Kα1 geometry for epitaxial thin films and everything in-between. Fully software controlled, at the push of a button.

无论样品类型和应用程序,和no matter if you are a novice or an expert user: The D8 ADVANCE Plus sets a new benchmark in data quality thanks to its unparalleled flexibility and easy-of-use.

The patented TRIO optics simplify the usage of the D8 ADVANCE, allowing the largest variety of applications and sample types. With user convenience in mind, the system features automatic, motorized switching between up to 6 different beam geometries. Without manual user intervention, the system is capable of switching between three beampaths:

• Focusing Bragg-Brentano for powders
• 毛细管，GID和XRR的高强度平行梁Kα1,2
• 外延薄膜的高分辨率平行梁Kα1几何形状

It is perfectly suited for all sample types including powder, bulk, fiber, sheet and thin-film (amorphous, polycrystalline and epitaxial) under ambient or non-ambient conditions.

Multimode functionality (0D-1D-2D, snapshot and scanning modes) allows the EIGER2 R detectors to cover a wide range of measurement methods ranging from powder to materials research applications. Not the typical jack of all trades, the EIGER2 is a master of all applications. With a dynamic range that allows absorber free measurements, large 1D size for ultra fast powder measurements and rapid reciprocal space maps and over 500k pixels for large two dimensional coverage, the EIGER2 sets a new standard for multimode detectors. The EIGER2 combines beamline detector technology from DECTRIS Ltd. with software and hardware integration from BRUKER into a seamless easy to use solution.

X射线粉末衍射（XRPD）技术是材料表征的最重要工具之一。bob综合游戏嵌入到粉末图案中的许多信息直接从存在的相的原子排列中得出。D8 Advance和Fiffrac.Suite软件允许支持简单执行常见XRPD方法：

• Identification of both crystalline and amorphous phases and determination of specimen purity
• 定量分析的水晶和埃莫phous phases in multi-phase mixtures
• Microstructure analysis (crystallite size, microstrain, disorder…)
• Bulk residual stress resulting from thermal treatment or machining in manufactured components
• Texture (preferred orientation) analysis
• 索引，Ab-Initio晶体结构测定和晶体结构的细化

Analysis of thin films and coatings is based on the same principles of XRPD, but with further beam conditioning and angular control. Typical examples include, but are not limited to, phase identification, crystalline quality, residual stress, texture analysis, thickness determination and composition vs strain analysis. Analysis of thin films and coatings is focusing on properties of layered materials with nm to µm thickness, ranging from amorphous and poly-crystalline coatings to epitaxially grown films. The D8 ADVANCE and the DIFFRAC.SUITE software enable high quality analyses of thin films including:

• Grazing Incidence Diffraction
• X-Ray Reflectometry
• High Resolution X-ray Diffraction
• 相互空间映射